Jammy, S. P.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

From Teacher-Designer to Student-Researcher: a Study of Attitude Change Regarding Creativity in STEAM Education by Using Makey Makey as a Platform for Human-Centred Design Instrument

Chen, Chi Wai Jason, Lo, Kit Mei Jammie

Journal:

Journal for STEM Education Research

Year:

2019

Language:

english

File:

PDF, 1.98 MB

english, 2019

2

Motivational Interviewing at the Intersections of Depression and Intimate Partner Violence among African American Women

Wahab, Stéphanie, Trimble, Jammie, Mejia, Angie, Mitchell, S. Renee, Thomas, Mary Jo, Timmons, Vanessa, Waters, A. Star, Raymaker, Dora, Nicolaidis, Christina

Journal:

Journal of Evidence-Based Social Work

Year:

2014

Language:

english

File:

PDF, 247 KB

english, 2014

3

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - A novel damage-free high-k etch technique using neutral beam-assisted atomic layer etching (NBALE) for sub-32nm technology node low power metal gate/high-k dielectric CMOSFETs

Min, K.S., Kang, C. Y., Park, C., Park, C. S., Park, B. J., Park, J. B., Hussain, M. M., Lee, Jack C., Lee, B. H., Kirsch, P., Tseng, H-H., Jammy, R., Yeom, G. Y.

Year:

2009

Language:

english

File:

PDF, 738 KB

english, 2009

4

AIP Conference Proceedings [AIP ION IMPLANTATION TECHNOLOGY 2012: Proceedings of the 19th International Conference on Ion Implantation Technology - Valladolid, Spain (25–29 June 2012)] - High-k metal-gate PMOS FinFET threshold voltage tuning with aluminum implantation

Rao, K. V., Ngai, T., Hobbs, C., Rodgers, M., Vivekanand, S., Chavva, V., Khaja, F., Henry, T., Shim, K. H., Kirsch, P., Jammy, R.

Year:

2012

Language:

english

File:

PDF, 353 KB

english, 2012

5

[IEEE 2018 China Semiconductor Technology International Conference (CSTIC) - Shanghai (2018.3.11-2018.3.12)] 2018 China Semiconductor Technology International Conference (CSTIC) - Study of Plug Etch back process matching on faraday shielded ICP and traditional CCP plasma ETCH chambers

Fu, Yali, Ma, Shawming, Wang, Yi, Xiao, Jammy, Kim, M H, Zhang, Nancy, Jiao, Mingjie, Wang, Frank, Lee, Tammy

Year:

2018

File:

PDF, 1.16 MB

2018

6

Gate-First Integration of Tunable Work Function Metal Gates of Different Thicknesses Into High-/Metal Gates CMOS FinFETs for Multi- Engineering

Hussain, M.M., Smith, C.E., Harris, H.R., Young, C.D., Hsing-Huang Tseng, Jammy, R.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 866 KB

english, 2010

7

Impact of Millisecond Flash-Assisted Rapid Thermal Annealing on SiGe Heterostructure Channel pMOSFETs With a High-/Metal Gate

Se-Hoon Lee, Majhi, P., Ferrer, D.A., Pui-Yee Hung, Huang, J., Oh, J., Wei-Yip Loh, Sassman, B., Byoung-Gi Min, Hsing-Huang Tseng, Harris, R., Bersuker, G., Kirsch, P.D., Jammy, R., Banerjee, S.K.

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 964 KB

english, 2011

8

Novel CuO Nanoparticle Catalyzed C−N Cross Coupling of Amines with Iodobenzene

Rout, Laxmidhar, Jammi, Suribabu, Punniyamurthy, T.

Journal:

Organic Letters

Year:

2007

Language:

english

File:

PDF, 77 KB

english, 2007

9

Improvement of metal gate/high-k dielectric CMOSFETs characteristics by atomic layer etching of high-k gate dielectric

Min, K.S., Park, C., Kang, C.Y., Park, C.S., Park, B.J., Kim, Y.W., Lee, B.H., Lee, Jack C., Bersuker, G., Kirsch, P., Jammy, R., Yeom, G.Y.

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 442 KB

english, 2013

10

[IEEE 2011 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2011.04.25-2011.04.27)] Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications - High temperature millisecond silicide anneal for contact resistivity < 10−8 Ωcm2

Loh, W.-Y, Yang, Y. R., Hung, P. Y., Sassman, B., Kenney, C., Bersuker, G., Majhi, P., Kirsch, P. D., Jammy, R.

Year:

2011

Language:

english

File:

PDF, 558 KB

english, 2011

11

[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability Assessment on Highly Manufacturable MOSFETs with Metal Gate and Hf based Gate Dielectrics

Choi, Rino, Young, Chadwin, Kang, Chang Yong, Heh, Dawei, Bersuker, Gennadi, Krishnan, Siddarth, Kirsch, Paul, Neugroschel, Arnost, Song, S.C., Lee, B. H., Jammy, R.

Year:

2007

Language:

english

File:

PDF, 2.58 MB

english, 2007

12

[IEEE 2010 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2010.06.15-2010.06.17)] 2010 Symposium on VLSI Technology - Enhanced performance in SOI FinFETs with low series resistance by aluminum implant as a solution beyond 22nm node

Ok, I., Young, C. D., Loh, W. Y., Ngai, T., Lian, S., Oh, J., Rodgers, M. P., Bennett, S., Stamper, H. O., Franca, D. L., Lin, S., Akarvardar, K., Smith, C., Hobbs, C., Kirsch, P., Jammy, R.

Year:

2010

Language:

english

File:

PDF, 906 KB

english, 2010

13

Reliability of La-Doped Hf-Based Dielectrics nMOSFETs

Chang Yong Kang,, Kirsch, P.D., Byoung Hun Lee,, Hsing-Huang Tseng,, Jammy, R.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2009

Language:

english

File:

PDF, 1.55 MB

english, 2009

14

Epidemiology of systemic sclerosis

Barnes, Jammie, Mayes, Maureen D.

Journal:

Current Opinion in Rheumatology

Year:

2012

Language:

english

File:

PDF, 196 KB

english, 2012

15

Problems, Control, and Treatment of Fat, Oil, and Grease (FOG): A Review

Husain, Iman A. F., Alkhatib, Ma’an Fahmi, Jammi, Mohamed Saedi, Mirghani, Mohamed E. S., Zainudin, Zaki Bin, Hoda, Asif

Journal:

Journal of Oleo Science

Year:

2014

Language:

english

File:

PDF, 632 KB

english, 2014

16

[ASME ASME Turbo Expo 2014: Turbine Technical Conference and Exposition - Düsseldorf, Germany (Monday 16 June 2014)] Volume 7A: Structures and Dynamics - Crack Propagation Life Calculation of an Aircraft Compressor Blade due to Bird Ingestion

Jammi, Srinivasa R., Rzadkowski, R.

Year:

2014

Language:

english

File:

PDF, 1.35 MB

english, 2014

17

Dispersive detection of radio-frequency-dressed states

Jammi, Sindhu, Pyragius, Tadas, Bason, Mark G., Florez, Hans Marin, Fernholz, Thomas

Journal:

Physical Review A

Year:

2018

Language:

english

File:

PDF, 1.25 MB

english, 2018

18

Insights into crustal architecture and tectonics across Palghat Cauvery Shear Zone, India from combined analysis of gravity and magnetic data

Ganguli, Shuva Shankha, Pal, Sanjit Kumar, Singh, Sant Lal, Rama Rao, Jammi Venkata, Balakrishna, Beechani

Journal:

Geological Journal

Year:

2020

File:

PDF, 19.31 MB

2020

19

Effect of Si capping layer on the interface quality and NBTI of high mobility channel Ge-on-Si pMOSFETs

Ook Sang Yoo, Jungwoo Oh, Kyung Seok Min, Chang Yong Kang, B.H. Lee, Kyong Taek Lee, Min Ki Na, Hyuk-Min Kwon, P. Majhi, H-H Tseng, Raj Jammy, J.S. Wang, Hi-Deok Lee

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 320 KB

english, 2009

20

Chiral binuclear copper(II) catalyzed nitroaldol reaction: scope and mechanism

Suribabu Jammi, Prasenjit Saha, Sridhar Sanyashi, Sekarpandi Sakthivel, Tharmalingam Punniyamurthy

Journal:

Year:

2008

Language:

english

File:

PDF, 824 KB

english, 2008

21

Production and consumption of wild date palm sap and country liquor in two tribal village ecosystems of eastern Ghats of Orissa, India

S.Jammi Naidu, Malaya K. Misra

Journal:

Bioresource Technology

Year:

1998

Language:

english

File:

PDF, 602 KB

english, 1998

22

Gate stack technology for nanoscale devices

Byoung Hun Lee, Jungwoo Oh, Hsing Huang Tseng, Rajarao Jammy, Howard Huff

Journal:

Materials Today

Year:

2006

Language:

english

File:

PDF, 809 KB

english, 2006

23

THE RECURSIVE FITTING OF SUBSET VARX MODELS

Jack H. W. Penm, Jammie H. Penm, R. D. Terrell

Journal:

Journal of Time Series Analysis

Year:

1993

Language:

english

File:

PDF, 748 KB

english, 1993

24

Highly scaled (Lg ∼ 56 nm) gate-last Si tunnel field-effect transistors with ION > 100 μA/μm

Wei-Yip Loh, Kanghoon Jeon, Chang Yong Kang, Jungwoo Oh, Tsu-Jae King Liu, Hsing-Huang Tseng, Wade Xiong, Prashant Majhi, Raj Jammy, Chenming Hu

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 660 KB

english, 2011

25

Grain boundary-driven leakage path formation in HfO2 dielectrics

G. Bersuker, J. Yum, L. Vandelli, A. Padovani, L. Larcher, V. Iglesias, M. Porti, M. Nafría, K. McKenna, A. Shluger, P. Kirsch, R. Jammy

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 1.16 MB

english, 2011

26

Comparison of Ohmic contact resistances of n- and p-type Ge source/drain and their impact on transport characteristics of Ge metal oxide semiconductor field effect transistors

Jungwoo Oh, Jeff Huang, Yen-Ting Chen, Injo Ok, Kanghoon Jeon, Se-Hoon Lee, Barry Sassman, Wei-Yip Loh, Hi-Deok Lee, Dea-Hong Ko, Prashant Majhi, Paul Kirsch, Raj Jammy

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 541 KB

english, 2011

27

Impact of NiPt Thickness Scaling on Contact Resistance From Thin-Body FD SOI to Trigate FETs

Akarvardar, K., Rodgers, M., Kaushik, V., Johnson, C.S., Hyuncher Chong, Injo Ok, Kah-Wee Ang, Gausepohl, S., Hobbs, C., Kirsch, P., Jammy, R.

Journal:

IEEE Electron Device Letters

Year:

2012

Language:

english

File:

PDF, 550 KB

english, 2012

28

Swept under the rug: the problem of unacknowledged ambiguity in lithic residue identification

Gilliane F. Monnier, Jammi L. Ladwig, Samantha T. Porter

Journal:

Journal of Archaeological Science

Year:

2012

Language:

english

File:

PDF, 4.48 MB

english, 2012

29

[IEEE 2012 IEEE International Conference on IC Design & Technology (ICICDT) - Austin, TX, USA (2012.05.30-2012.06.1)] 2012 IEEE International Conference on IC Design & Technology - Emerging CMOS and beyond CMOS technologies for an ultra-low power 3D world

Kang, CY, Ang, KW, Hill, R., Loh, WY, Oh, J., Lee, R., Gilmer, D., Bersuker, G., Hobbs, C., Kirsch, P., Hummler, K., Arkalgud, S., Jammy, R.

Year:

2012

Language:

english

File:

PDF, 1.25 MB

english, 2012

30

[IEEE 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Technology, System and Application - Understanding and improving SILC behavior under TDDB stress in full gate-last high-k/metal gate nMOSFETs

Minseok Jo,, Chang Young Kang,, Kah-Wee Ang,, Huang, J., Kirsch, P., Jammy, R.

Year:

2012

Language:

english

File:

PDF, 1.16 MB

english, 2012

31

[IEEE 2011 3rd IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2011.05.22-2011.05.25)] 2011 3rd IEEE International Memory Workshop (IMW) - Effects of RRAM Stack Configuration on Forming Voltage and Current Overshoot

Gilmer, D. C., Bersuker, G., Park, H.-Y., Park, C., Butcher, B., Wang, W., Kirsch, P. D., Jammy, R.

Year:

2011

Language:

english

File:

PDF, 749 KB

english, 2011

32

A review of the relationship between sociocultural factors and juvenile psychopathy

Rubio, Jammie S., Krieger, Michelle A., Finney, Emmanuel J., Coker, Kendell L.

Journal:

Aggression and Violent Behavior

Year:

2014

Language:

english

File:

PDF, 301 KB

english, 2014

33

Improvement of metal gate/high-k dielectric CMOSFETs characteristics by neutral beam etching of metal gate

Min, K.S., Park, C., Kang, C.Y., Park, C.S., Park, B.J., Kim, Y.W., Lee, B.H., Lee, Jack C., Bersuker, G., Kirsch, P., Jammy, R., Yeom, G.Y.

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 576 KB

english, 2013

34

Reliability study of methods to suppress boron transient enhanced diffusion in high-k/metal gate Si/SiGe channel pMOSFETs

Park, Min Sang, Kim, Yonghyun, Lee, Kyong Taek, Kang, Chang Yong, Min, Byoung-Gi, Oh, Jungwoo, Majhi, Prashant, Tseng, Hsing-Huang, Lee, Jack C., Banerjee, Sanjay K., Lee, Jeong-Soo, Jammy, Raj, Jeong

Journal:

Microelectronic Engineering

Year:

2013

Language:

english

File:

PDF, 820 KB

english, 2013

35

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Grain boundary-driven leakage path formation in HfO2 dielectrics

Bersuker, G., Yum, J., Iglesias, V., Porti, M., Nafria, M., McKenna, K., Shluger, A., Kirsch, P., Jammy, R.

Year:

2010

Language:

english

File:

PDF, 560 KB

english, 2010

36

A Study of Strain Engineering Using CESL Stressor on Reliability Comparing Effect of Intrinsic Mechanical Stress

Kyong Taek Lee, Chang Yong Kang, Min-sang Park, Byoung Hun Lee, Ho Kyung Park, Hyun Sang Hwang, Hsing-huang Tseng, R. Jammy, Yoon-ha Jeong

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 431 KB

english, 2009

37

In-situ growth of Pb(Zr 0.5 Ti 0.5 )O 3 /RuO 2 heterostructures on Si(001) using low-temperature metal-organic chemical vapor deposition

Foster, C. M., Bai, G.-R., Wang, A., Vetrone, J., Huang, Y., Jammy, R.

Journal:

Integrated Ferroelectrics

Year:

1997

Language:

english

File:

PDF, 1017 KB

english, 1997

38

High frequency electrical characterization of bst capacitors

Jammy, Rajmo, Wills, Laura A.

Journal:

Integrated Ferroelectrics

Year:

1997

Language:

english

File:

PDF, 559 KB

english, 1997

39

Time-Dependent Dielectric Breakdown of $\hbox{La}_{2} \hbox{O}_{3}$-Doped High-$k$/Metal Gate Stacked NMOSFETs

In-Shik Han,, Won-Ho Choi,, Hyuk-Min Kwon,, Min-Ki Na,, Ying-Ying Zhang,, Yong-Goo Kim,, Jin-Suk Wang,, Chang Yong Kang,, Bersuker, G., Byoung Hun Lee,, Yoon Ha Jeong,, Hi-Deok Lee,, Jammy,

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 306 KB

english, 2009

40

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Effect of substrate hot carrier stress on high-k gate stack

Park, Hokyung, Bersuker, Gennadi, Kang, Chang Yong, Young, Chadwin, Tseng, Hsing-Huang, Jammy, Raj

Year:

2008

Language:

english

File:

PDF, 4.08 MB

english, 2008

41

A Comparative NBTI Study of $\hbox{HfO}_{2}$, $\hbox{HfSiO}_{x}$, and SiON p-MOSFETs Using UF-OTF $I_{\rm DLIN}$ Technique

Deora, S., Maheta, V.D., Bersuker, G., Olsen, C., Ahmed, K.Z., Jammy, R., Mahapatra, S.

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 144 KB

english, 2009

42

[IEEE 2008 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) - Hsinchu, Taiwan (2008.04.21-2008.04.23)] 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Understanding Strain Effects on Double-Gate FinFET Drive-Current Enhancement, Hot-Carrier Reliability and Ring-Oscillator Delay Performance via Uniaxial Wafer Bending Experiments

Suthram, Sagar, Harris, H. R., Hussain, M. M., Smith, C., Young, C. D., Yang, J.-W., Mathews, K., Freeman, K., Majhi, P., Tseng, H. H.-H., Jammy, R., Thompson, Scott E.

Year:

2008

Language:

english

File:

PDF, 2.38 MB

english, 2008

43

Validation and Use of an Instrument to Measure the Learning Environment as Perceived by Medical Students

Pololi, Linda, Price, Jammie

Journal:

Teaching and Learning in Medicine

Year:

2000

Language:

english

File:

PDF, 68 KB

english, 2000

44

-State Leakage and Reliability in Metal-Gate/High- $k$ Dielectric MOSFETs

Kyong Taek Lee,, Chang Yong Kang,, Byung Sun Ju,, Choi, R., Kyung Seok Min,, Ook Sang Yoo,, Byoung Hun Lee,, Jammy, R., Lee, J.C., Hi-Deok Lee,, Yoon-Ha Jeong,

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 409 KB

english, 2008

45

[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - 300mm FinFET results utilizing conformal, damage free, ultra shallow junctions (Xj∼5nm) formed with molecular monolayer doping technique

Ang, K.-W., Barnett, J., Loh, W.-Y., Huang, J., Min, B.-G., Hung, P. Y., Ok, I., Yum, J. H., Bersuker, G., Rodgers, M., Kaushik, V., Gausepohl, S., Hobbs, C., Kirsch, P. D., Jammy, R.

Year:

2011

Language:

english

File:

PDF, 3.75 MB

english, 2011

46

[IEEE 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Hsinchu, Taiwan (2007.04.23-2007.04.25)] 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Issues associated with p-type band-edge effective work function metal electrodes: Fermi-level pinning and flatband roll-off

Wen, Huang-Chun, Choi, Kisik, Park, C. S., Majhi, Prashant, Harris, H. Rusty, Niimi, Hiro, Park, D. Hong-Bae, Bersuker, Gennadi, Lysaght, Patrick, Kwong, D. L., Song, S.C., Lee, Byoung Hun, Jammy, Raj

Year:

2007

Language:

english

File:

PDF, 1.11 MB

english, 2007

47

(Invited) Electrical Characterization and Reliability Assessment of Double-Gate FinFETs

Young, C. D., Akarvardar, K., Matthews, K., Baykan, M. O., Pater, J., Ok, I., Ngai, T., Ang, K.-W., Minakais, M., Bersuker, G., Deora, S., Hobbs, C., Kirsch, P., Jammy, R.

Journal:

ECS Transactions

Year:

2013

Language:

english

File:

PDF, 207 KB

english, 2013

48

Paired Snap-On Buttons Connections for Balanced Antennas in Wearable Systems

Chen, Shengjian Jammy, Fumeaux, Christophe, Ranasinghe, Damith Chinthana, Kaufmann, Thomas

Journal:

IEEE Antennas and Wireless Propagation Letters

Year:

2015

Language:

english

File:

PDF, 1.31 MB

english, 2015

49

BOOK REVIEWS

Cailliet, Rene, Rockwood, Charles, Barnes, Jammie, Hatch, John, Schneider, Heidi

Journal:

Journal of Musculoskeletal Pain

Year:

2006

Language:

english

File:

PDF, 39 KB

english, 2006

50

Effects of maternal exposure to phthalates and bisphenol A during pregnancy on gestational age

Weinberger, Barry, Vetrano, Anna M., Archer, Faith E., Marcella, Stephen W., Buckley, Brian, Wartenberg, Daniel, Robson, Mark G., Klim, Jammie, Azhar, Sana, Cavin, Sarah, Wang, Lu, Rich, David Q.

Journal:

Journal of Maternal-Fetal and Neonatal Medicine

Year:

2014

Language:

english

File:

PDF, 187 KB

english, 2014

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски